Title :
Statistical Modeling Techniques for thhe Simulation of Mismatch in ICs
Author :
Guardiani, C. ; Alini, R. ; Benkoski, J. ; Espinosa, G.
Author_Institution :
SGS-Thomson Microelectronics, v.Olivetti 2, 20041 Agrate B.za, ITALY
Abstract :
An innovative technique which uses statistical modeling methods to simulate the mismatch of ICs components is presented in this paper. The proposed method is more general than previously published theories, being applicable up to very small device sizes. The present approach has been used to simulate the effect of mismatch on a complex analog circuit. Comparison with measured data confirms the accuracy and efficiency of the method.
Keywords :
Analog circuits; Circuit simulation; Distributed computing; Extraterrestrial measurements; Fluctuations; Integrated circuit measurements; Integrated circuit modeling; Microelectronics; Probability distribution; Random variables;
Conference_Titel :
Solid-State Circuits Conference, 1993. ESSCIRC '93. Nineteenth European
Conference_Location :
Sevilla, Spain
Print_ISBN :
2-86335-134-X
