• DocumentCode
    516662
  • Title

    A Precision Measurement System for Modulated Signals

  • Author

    Gruber, W. ; O´Leary, P. ; Lee, P. ; Schucter, W.

  • Author_Institution
    Institute for Chemical and Optical Sensors, Joanneum Research, Graz, Austria
  • fYear
    1994
  • fDate
    20-22 Sept. 1994
  • Firstpage
    220
  • Lastpage
    223
  • Abstract
    This paper presents a new solution to a precision measurement system for modulated signals based on oversampling techniques. A modular approach, based around a single ASIC device, has been used to ensure that the system can be easily adapted to a number of applications. An analysis of the system is presented together with measurements which verify the functionality of the system. A 20-bit dynamic range has been achieved, where 1 LSB corresponds to 2.5 pA and a signal to noise ratio of 114 dB has been measured. The circuit has been implemented in a 1.2 ¿m CMOS process and required 15.7 mm2.
  • Keywords
    Chemical sensors; Circuits; Demodulation; Digital modulation; Optical amplifiers; Optical modulation; Optical sensors; Semiconductor device measurement; Synthesizers; Transversal filters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1994. ESSCIRC '94. Twentieth European
  • Conference_Location
    Ulm, Germany
  • Print_ISBN
    2-86332-160-9
  • Type

    conf

  • Filename
    5468493
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=516662