Title :
Testing Microprocessors
Author_Institution :
Siemens AG, Munich, Germany
Abstract :
The testability of microprocessors has become a very important question especially for device manufacturers. This paper discusses a test strategy for microprocessors where the internal logic is separated into 2 types: data-logic and control-logic. A practical example is presented in the form of a test program for the SAB 8080A microprocessor.
Keywords :
integrated circuit manufacture; integrated circuit testing; microprocessor chips; control internal logic; data internal logic; microprocessor testing; Automatic control; Automatic testing; Clocks; Control systems; Decoding; Functional programming; Logic testing; Manufacturing; Microprocessors; System testing;
Conference_Titel :
Solid State Circuits Conference - Digest of Technical Papers, 1978. ESSCIRC 78. 4th European
Conference_Location :
Amsterdam
