DocumentCode :
517069
Title :
An Integrated Bandgap-Reference
Author :
Meijer, G.C.M. ; Verhoeff, J.B.
Author_Institution :
Delft University of Technology, Dept. of Electrical Engineering, Holland.
fYear :
1975
fDate :
2-5 Sept. 1975
Firstpage :
40
Lastpage :
41
Keywords :
Circuit testing; Current supplies; Diodes; Low-frequency noise; Mirrors; Photonic band gap; Solid state circuits; Temperature dependence; Temperature distribution; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Circuits Conference (ESSCIRC), 1975 First European
Conference_Location :
Canterbury, UK
Print_ISBN :
0-85296-149-9
Type :
conf
Filename :
5469116
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=517069
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