• DocumentCode
    517087
  • Title

    DC Analysis of Non-Linear Circuits using Solution Tracing Circuits

  • Author

    Inoue, Yasuaki

  • Author_Institution
    LSI Division. Semiconductor Business Headquarters., SANYO Electric Co., Ltd., 180, Sakata Oizumi-machi, Ora-gun, Gunma-ken, 370-05 Japan
  • Volume
    1
  • fYear
    1991
  • fDate
    11-13 Sept. 1991
  • Firstpage
    41
  • Lastpage
    44
  • Abstract
    A practical method of analyzing multi-valued DC characteristic curves of non-linear circuits is proposed. In this method, the characteristic curves can easily be traced by executing TRAN analysis with a conventional general-purpose circuit simulator. Some numerical examples including a bipolar analog 1C are also presented to demonstrate the effectiveness of this method.
  • Keywords
    Bandwidth; Capacitors; Chirp modulation; Circuit analysis; Delay effects; Frequency modulation; Linearity; Switching circuits; Threshold voltage; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1991. ESSCIRC '91. Proceedings - Seventeenth European
  • Conference_Location
    Milan, Italy
  • Type

    conf

  • Filename
    5469134
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=517087