Title :
CHIL and I2L with Passive Isolation
Author :
Müller, R. ; Graul, J.
Author_Institution :
Siemens AG, Munich
Keywords :
Circuit testing; Epitaxial layers; Equivalent circuits; Integrated circuit technology; Isolation technology; Logic circuits; Propagation delay; Pulse inverters; Ring oscillators; Schottky diodes;
Conference_Titel :
Solid State Circuits Conference (ESSCIRC), 1975 First European
Conference_Location :
Canterbury, UK
Print_ISBN :
0-85296-149-9