Title :
On-Line and Off-Line Testing: From Digital to Analog, from Circuits to Boards
Author :
Courtois, Bernard ; Lubaszewski, Marcelo
Author_Institution :
TIMA, 46 avenue Félix Viallet, 38031 GRENOBLE Cedex, FRANCE. Fax: +33 76 47 38 14, E-mail: Bernard.Courtois@imag.fr
Abstract :
The goal of this paper is to review the design of circuits and systems featuring testing capabilities. Those capabilities include self-checking properties necessary for on-line testing as well as BIST. The design of fail-safe reliable ASICs and boards is broadly addressed. The basic milestones over the last 25 years are reviewed and longterm perspectives are discussed.
Keywords :
Application specific integrated circuits; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Circuits and systems; Design for testability; Production; Signal design; System testing; BIST; DFT; Self-checking circuits; UBIST; fail-safe systems; strongly code disjoint checkers; strongly fault secure circuits;
Conference_Titel :
Solid-State Circuits Conference, 1995. ESSCIRC '95. Twenty-first European
Conference_Location :
Lille, France
Print_ISBN :
2-86332-180-3
