• DocumentCode
    517265
  • Title

    Design for Testability of Analog-Digital System using Behavior Model

  • Author

    Zagursky, V. ; Karpov, A. ; Sirovatkina, M.

  • Author_Institution
    IECS, Latvian Academy of Sciences, 14 Dzerbenes str., LV-1006, Riga, Latvia.
  • fYear
    1995
  • fDate
    19-21 Sept. 1995
  • Firstpage
    322
  • Lastpage
    325
  • Abstract
    The authors propose a design for testability of analog-digital systems (ADS). It is developed linear inertial heteroscedastic ADS model, that takes account of nonlinear and inertial conversion effects. The validity of the model is verified by actual measurements of the dynamic responses of a 14-bit analog-digital converter (ADC).
  • Keywords
    Analog-digital conversion; Design for testability; Frequency response; IEC; Nonlinear dynamical systems; Power system modeling; Quantization; Signal design; Signal to noise ratio; Stochastic resonance; analog-digital systems; behavioral model; design for testability; mixed signal system; stochastic models;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1995. ESSCIRC '95. Twenty-first European
  • Conference_Location
    Lille, France
  • Print_ISBN
    2-86332-180-3
  • Type

    conf

  • Filename
    5469401
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=517265