• DocumentCode
    51797
  • Title

    Theoretical and Empirical Evaluation of Surface Roughness Effects on Conductivity in the Terahertz Regime

  • Author

    Yang, Benjamin B. ; Kirley, M.P. ; Booske, John H.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • Volume
    4
  • Issue
    3
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    368
  • Lastpage
    375
  • Abstract
    While models for conductivity in the terahertz regime are improving, there is limited data on the effects of submicrometer roughness features on conductivity. We present direct measurements of the effective conductivity of samples with periodic controlled roughness features using an open quasi-optical resonator at 400 and 650 GHz. The empirical results are compared with two closed-form models and a finite-element simulation. We find that the Mie-scattering-based model and finite-element approach are more accurate for samples that are smooth relative to the skin depth. For surface features greater than the skin depth, we found the Hammerstad and Bekkadal model to be a better predictor of effective conductivity. The observed discrepancies identify the need for further advances in theoretical understanding of the underlying physics. The empirical results of this study can be used to benchmark new and improved models of effective conductivity in the terahertz regime.
  • Keywords
    surface conductivity; surface roughness; terahertz waves; Bekkadal model; Hammerstad model; Mie-scattering-based model; finite-element approach; finite-element simulation; frequency 400 GHz; frequency 650 GHz; open quasi-optical resonator; periodic controlled roughness; surface conductivity; surface roughness; terahertz regime; Conductivity; Conductivity measurement; Gratings; Materials; Mirrors; Rough surfaces; Surface roughness; Conductivity; electromagnetic (EM) material characterization; resonators; surface roughness; terahertz (THz);
  • fLanguage
    English
  • Journal_Title
    Terahertz Science and Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-342X
  • Type

    jour

  • DOI
    10.1109/TTHZ.2014.2310121
  • Filename
    6778094