DocumentCode :
519199
Title :
Electrical properties of bismuth potassium titanate-strontium titanate ferroelectric ceramics
Author :
Phetnoi, Prapapim ; Niemcharoen, Surasak ; Muanghlua, Rangson ; Sutapun, Manoon ; Vittayakorn, Naratip
Author_Institution :
Dept. of Electron., King Mongkut´´s Inst. of Technol. Ladkrabang, Bangkok, Thailand
fYear :
2010
fDate :
19-21 May 2010
Firstpage :
962
Lastpage :
965
Abstract :
In this paper, lead-free (Bi0.5K0.5)TiO3 ceramics doped with SrTiO3 was prepared by the conventional solid state reaction method with sintering temperature at 1040°C. The samples were characterized by X-ray diffraction analysis and Scanning Electron Microscopy. The dielectric, ferroelectric properties were also investigated. The results of X-ray diffraction reveal that SrTiO3 diffuse into the Bi0.5K0.5TiO3 lattices to form a solid solution with a pure perovskite structure. After the introduction of SrTiO3 into Bi0.5K0.5TiO3, the dielectric constant at room temperature (εr) was found to decrease with increasing SrTiO3. The broadness of the dielectric constant peak was observed with increasing SrTiO3 content, especially that of the 0.94Bi0.5K0.5TiO3 - 0.06 SrTiO3 ceramic which exhibited a very broad curve over a wide temperature range. The Bi0.5K0.5TiO3 - SrTiO3 system was expected to be a new and promising candidate for lead-free capacitors.
Keywords :
X-ray diffraction; bismuth compounds; ferroelectric ceramics; permittivity; potassium compounds; scanning electron microscopy; sintering; strontium compounds; Bi0.5K0.5TiO3:SrTiO3; X-ray diffraction analysis; bismuth potassium titanate; conventional solid state reaction; dielectric constant; dielectric properties; electrical properties; ferroelectric ceramics; ferroelectric properties; lead-free ceramics; pure perovskite structure; scanning electron microscopy; sintering; strontium titanate; temperature 1040 degC; temperature 293 K to 298 K; Bismuth; Ceramics; Dielectric constant; Electrons; Environmentally friendly manufacturing techniques; Ferroelectric materials; Solid state circuits; Temperature; Titanium compounds; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Engineering/Electronics Computer Telecommunications and Information Technology (ECTI-CON), 2010 International Conference on
Conference_Location :
Chiang Mai
Print_ISBN :
978-1-4244-5606-2
Electronic_ISBN :
978-1-4244-5607-9
Type :
conf
Filename :
5491563
Link To Document :
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