Title :
Crystallization Process and Magnetic Properties of Amorphous
Nanoparticles
Author :
Nguyen Dang Phu ; Nguyen Van Hung ; Luc Huy Hoang ; Nguyen Van Minh ; Le Mai Oanh ; Danh Bich Do
Author_Institution :
Fac. of Phys., Hanoi Nat. Univ. of Educ., Hanoi, Vietnam
Abstract :
We investigate the crystallization process of NiFe2O4 nanoparticles prepared by microwave heating technique, which were then characterized using X-ray diffraction, high-resolution transmission electron microscopy, the differential scanning calorimetry, Raman scattering, Fourier transformed infrared spectra (FTIR), and magnetic measurements. The results showed that crystallization of the amorphous NiFe2O4 nanoparticles occurred at around 300 °C. The best crystallization quality would be obtained by annealing the sample at 500 °C. After crystallization, the sample shows ferromagnetic behavior with a saturation magnetization of about 30 emu/g. The FTIR and Raman measurements also provided further information about the crystallization process and the phase transformation of the NiFe2O4 nanoparticles.
Keywords :
Fourier transform spectra; Raman spectra; X-ray diffraction; amorphous magnetic materials; annealing; crystallisation; differential scanning calorimetry; ferrites; ferromagnetic materials; infrared spectra; magnetic particles; magnetic transitions; magnetisation; nanofabrication; nanomagnetics; nanoparticles; nickel compounds; transmission electron microscopy; FTIR; Fourier transformed infrared spectra; NiFe2O4; Raman scattering; X-ray diffraction; amorphous nanoparticles; annealing; crystallization; differential scanning calorimetry; ferromagnetic property; high-resolution transmission electron microscopy; magnetic properties; microwave heating; phase transformation; saturation magnetization; temperature 500 degC; Annealing; Crystallization; Electromagnetic heating; Iron; Microwave oscillators; Microwave theory and techniques; Nanoparticles; Amorphous materials; ferrite; magnetic particles; magnetic properties;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2013.2297520