• DocumentCode
    520216
  • Title

    Measuring and characterizing quantum states and processes

  • Author

    James, Daniel F V

  • Author_Institution
    Dept. of Phys., Univ. of Toronto, Toronto, ON, Canada
  • fYear
    2010
  • fDate
    16-21 May 2010
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    I will give an introductory overview of current experimental techniques used to characterize the density matrix of a system and the quantum process describing a device, with emphasis on applications in quantum optics.
  • Keywords
    quantum optics; quantum optics; quantum processes; quantum states; system density matrix; Density measurement; Frequency estimation; Optical devices; Optical polarization; Performance evaluation; Physics; Quantum computing; Quantum mechanics; State estimation; Tomography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-55752-890-2
  • Electronic_ISBN
    978-1-55752-890-2
  • Type

    conf

  • Filename
    5499783
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=520216