DocumentCode
520229
Title
Characterization of SOI microrings using IR imaging
Author
Cooper, Michael L. ; Gupta, Greeshma ; Park, Jung S. ; Schneider, Mark A. ; Divliansky, Ivan B. ; Mookherjea, Shayan
Author_Institution
Univ. of California, La Jolla, CA, USA
fYear
2010
fDate
16-21 May 2010
Firstpage
1
Lastpage
2
Abstract
We demonstrate a non-invasive diagnostic method of quantitative infrared (IR) imaging, applied here to a series cascade of microring resonators fabricated in silicon-on-insulator. The IR images contain information on the otherwise inaccessible individual through-ports and the resonators themselves, providing coupling, loss and intensity-enhancement parameters for the individual rings.
Keywords
infrared imaging; optical waveguides; silicon-on-insulator; IR imaging; SOI microrings; microring resonators; quantitative infrared imaging; silicon-on-insulator; Cameras; Coupling circuits; Infrared imaging; Optical coupling; Optical fiber polarization; Optical fiber testing; Optical imaging; Optical resonators; Optical waveguides; Scanning electron microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
Conference_Location
San Jose, CA
Print_ISBN
978-1-55752-890-2
Electronic_ISBN
978-1-55752-890-2
Type
conf
Filename
5499798
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