DocumentCode :
521428
Title :
Reducing Si reflectance by improving density and uniformity of Si nanowires fabricated by metal-assisted etching
Author :
Shiu, Shu-Chia ; Lin, Shin-Bo ; Lin, Ching-Fuh
Author_Institution :
Grad. Inst. of Photonics & Optoelectron., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2010
fDate :
16-21 May 2010
Firstpage :
1
Lastpage :
2
Abstract :
A silicon surface treatment before metal-assisted etching increases the density of silicon nanowires. The improvement reduces the solar-weighted reflectance to as low as 3.3% for silicon nanowires with a length of only 0.87µm.
Keywords :
Etching; Light scattering; Nanowires; Optical reflection; Photovoltaic systems; Reflectivity; Silicon; Solar power generation; Surface morphology; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
978-1-55752-890-2
Electronic_ISBN :
978-1-55752-890-2
Type :
conf
Filename :
5501048
Link To Document :
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