• DocumentCode
    521656
  • Title

    Using Embedded-Atom Method (EAM) to Simulate Interaction of Intense Laser with Lead in LIBS

  • Author

    Lu, Yinfei ; Fu, Rao ; Zhang, Guizhong ; Xu, Degang ; Yao, Jianquan

  • Author_Institution
    Coll. of Precision Instrum. & Optoelectron. Eng., Tianjin Univ., Tianjin, China
  • fYear
    2010
  • fDate
    19-21 June 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, we represented our numerical results on LIBS (laser-induced breakdown spectroscopy) process in Lead, excited by intense laser pulses. We used the EAM scheme and the proposed potential form for Lead in molecule dynamics simulation of the ablated process without taking into account the complex solid-liquid-gas phase transition process, which can greatly simplify phase variation of Lead and provide good insight into energies of dislodged ions and crater formation. In our work, we mainly focused on the crater morphology during the laser ablation process, and made comparison of erosion processes for different pulse durations. For the plasma emission, we used statistical method to study the energy distribution of the jetted Lead ions and analyzed the its relevance with the spectral line intensity of Lead, which contributed to the characteristic 406-nm peak of Lead.
  • Keywords
    laser ablation; lead; molecular dynamics method; plasma production by laser; spectral line intensity; Pb; crater morphology; embedded-atom method; erosion; jetted Lead ions; laser ablation; laser-induced breakdown spectroscopy; molecule dynamics simulation; plasma emission; spectral line intensity; statistical method; wavelength 406 nm; Electric breakdown; Laser ablation; Laser excitation; Laser transitions; Morphology; Optical pulses; Plasma properties; Solid modeling; Spectroscopy; Statistical analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics and Optoelectronic (SOPO), 2010 Symposium on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-4963-7
  • Electronic_ISBN
    978-1-4244-4964-4
  • Type

    conf

  • DOI
    10.1109/SOPO.2010.5504283
  • Filename
    5504283