DocumentCode
521697
Title
Narrow Band Gap InSbN Films Fabricated by Two-Step Ion-Implantation for Long Wavelength Infrared Photodetection
Author
Chen, X.Z. ; Zhang, D.H. ; Liu, W. ; Wang, Y. ; Jin, Y.J. ; Li, J.H. ; Zhang, Sam S Y
Author_Institution
Sch. of Electr. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear
2010
fDate
19-21 June 2010
Firstpage
1
Lastpage
4
Abstract
We report InSbN films prepared by two-step nitrogen ion implantation into InSb wafers. It is found that films of over 400 nm with nearly uniform nitrogen distribution can be formed and most of the implanted nitrogen ions can form In-N bonds, resulting in band gap bowing and reduction of carrier concentration. It is also found that such films can detect long wavelength infrared radiation and the absorption peak energies can be controlled by monitoring the implanted nitrogen dose. The measured peak wavelengths are consistent with the band gaps of the alloys calculated using a 10-band kp model.
Keywords
Electromagnetic wave absorption; Infrared detectors; Infrared surveillance; Ion implantation; Narrowband; Nitrogen; Photonic band gap; Radiation detectors; Radiation monitoring; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Photonics and Optoelectronic (SOPO), 2010 Symposium on
Conference_Location
Chengdu, China
Print_ISBN
978-1-4244-4963-7
Electronic_ISBN
978-1-4244-4964-4
Type
conf
DOI
10.1109/SOPO.2010.5504388
Filename
5504388
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