DocumentCode :
521697
Title :
Narrow Band Gap InSbN Films Fabricated by Two-Step Ion-Implantation for Long Wavelength Infrared Photodetection
Author :
Chen, X.Z. ; Zhang, D.H. ; Liu, W. ; Wang, Y. ; Jin, Y.J. ; Li, J.H. ; Zhang, Sam S Y
Author_Institution :
Sch. of Electr. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2010
fDate :
19-21 June 2010
Firstpage :
1
Lastpage :
4
Abstract :
We report InSbN films prepared by two-step nitrogen ion implantation into InSb wafers. It is found that films of over 400 nm with nearly uniform nitrogen distribution can be formed and most of the implanted nitrogen ions can form In-N bonds, resulting in band gap bowing and reduction of carrier concentration. It is also found that such films can detect long wavelength infrared radiation and the absorption peak energies can be controlled by monitoring the implanted nitrogen dose. The measured peak wavelengths are consistent with the band gaps of the alloys calculated using a 10-band kp model.
Keywords :
Electromagnetic wave absorption; Infrared detectors; Infrared surveillance; Ion implantation; Narrowband; Nitrogen; Photonic band gap; Radiation detectors; Radiation monitoring; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photonics and Optoelectronic (SOPO), 2010 Symposium on
Conference_Location :
Chengdu, China
Print_ISBN :
978-1-4244-4963-7
Electronic_ISBN :
978-1-4244-4964-4
Type :
conf
DOI :
10.1109/SOPO.2010.5504388
Filename :
5504388
Link To Document :
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