• DocumentCode
    521697
  • Title

    Narrow Band Gap InSbN Films Fabricated by Two-Step Ion-Implantation for Long Wavelength Infrared Photodetection

  • Author

    Chen, X.Z. ; Zhang, D.H. ; Liu, W. ; Wang, Y. ; Jin, Y.J. ; Li, J.H. ; Zhang, Sam S Y

  • Author_Institution
    Sch. of Electr. Eng., Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2010
  • fDate
    19-21 June 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We report InSbN films prepared by two-step nitrogen ion implantation into InSb wafers. It is found that films of over 400 nm with nearly uniform nitrogen distribution can be formed and most of the implanted nitrogen ions can form In-N bonds, resulting in band gap bowing and reduction of carrier concentration. It is also found that such films can detect long wavelength infrared radiation and the absorption peak energies can be controlled by monitoring the implanted nitrogen dose. The measured peak wavelengths are consistent with the band gaps of the alloys calculated using a 10-band kp model.
  • Keywords
    Electromagnetic wave absorption; Infrared detectors; Infrared surveillance; Ion implantation; Narrowband; Nitrogen; Photonic band gap; Radiation detectors; Radiation monitoring; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics and Optoelectronic (SOPO), 2010 Symposium on
  • Conference_Location
    Chengdu, China
  • Print_ISBN
    978-1-4244-4963-7
  • Electronic_ISBN
    978-1-4244-4964-4
  • Type

    conf

  • DOI
    10.1109/SOPO.2010.5504388
  • Filename
    5504388