• DocumentCode
    523588
  • Title

    Gate-level characterization: Foundations and hardware security applications

  • Author

    Wei, Sheng ; Meguerdichian, Saro ; Potkonjak, Miodrag

  • Author_Institution
    Comput. Sci. Dept., Univ. of California, Los Angeles, CA, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    222
  • Lastpage
    227
  • Abstract
    Gate-level characterization (GLC) is the process of characterizing each gate of an integrated circuit (IC) in terms of its physical and manifestation properties. It is a key step in the IC applications regarding cryptography, security, and digital rights management. However, GLC is challenging due to the existence of manufacturing variability (MV) and the strong correlations among some gates in the circuit. We propose a new solution for GLC by using thermal conditioning techniques. In particular, we apply thermal control on the process of GLC, which breaks the correlations by imposing extra variations concerning gate level leakage power. The scaling factors of all the gates can be characterized by solving a system of linear equations using linear programming (LP). Based on the obtained gate level scaling factors, we demonstrate an application of GLC, hardware Trojan horse (HTH) detection, by using constraint manipulation. We evaluate our approach of GLC and HTH detection on several ISCAS85/89 benchmarks. The simulation results show that our thermally conditioned GLC approach is capable of characterizing all the gates with an average error less than the measurement error, and we can detect HTHs with 100% accuracy on a target circuit.
  • Keywords
    Application specific integrated circuits; Cryptography; Digital integrated circuits; Equations; Hardware; Invasive software; Linear programming; Manufacturing; Process control; Security; Gate-level characterization; hardware Trojan horse; manufacturing variability; thermal conditioning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2010 47th ACM/IEEE
  • Conference_Location
    Anaheim, CA, USA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-4244-6677-1
  • Type

    conf

  • Filename
    5522644