DocumentCode
523705
Title
A statistical simulation method for reliability analysis of SRAM core-cells
Author
Fonseca, R.A. ; Dilillo, L. ; Bosio, A. ; Girard, P. ; Pravossoudovitch, S. ; Viraze, A. ; Badereddine, N.
Author_Institution
Infineon Technol. France, Sophia-Antipolis, France
fYear
2010
fDate
13-18 June 2010
Firstpage
853
Lastpage
856
Abstract
Reliability analysis of SRAM core-cells requires statistical methods with very high accuracy to cope with very low failure probabilities. Although new statistical methods have been recently proposed, to the best of our knowledge, there is no method able to evaluate the joint failure probability (the probability that at least one failure mechanism occurs) of an SRAM core-cell with enough accuracy in a reasonable time. We propose a statistical simulation method based on the analytical integration of the multivariate Gaussian distribution function.
Keywords
Analytical models; Computational modeling; Failure analysis; Measurement; Performance analysis; Probability; Random access memory; Random variables; Resource description framework; Sampling methods; Monte-Carlo; Reliability Analysis; SRAM Core-cell;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (DAC), 2010 47th ACM/IEEE
Conference_Location
Anaheim, CA, USA
ISSN
0738-100X
Print_ISBN
978-1-4244-6677-1
Type
conf
Filename
5522888
Link To Document