• DocumentCode
    523705
  • Title

    A statistical simulation method for reliability analysis of SRAM core-cells

  • Author

    Fonseca, R.A. ; Dilillo, L. ; Bosio, A. ; Girard, P. ; Pravossoudovitch, S. ; Viraze, A. ; Badereddine, N.

  • Author_Institution
    Infineon Technol. France, Sophia-Antipolis, France
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    853
  • Lastpage
    856
  • Abstract
    Reliability analysis of SRAM core-cells requires statistical methods with very high accuracy to cope with very low failure probabilities. Although new statistical methods have been recently proposed, to the best of our knowledge, there is no method able to evaluate the joint failure probability (the probability that at least one failure mechanism occurs) of an SRAM core-cell with enough accuracy in a reasonable time. We propose a statistical simulation method based on the analytical integration of the multivariate Gaussian distribution function.
  • Keywords
    Analytical models; Computational modeling; Failure analysis; Measurement; Performance analysis; Probability; Random access memory; Random variables; Resource description framework; Sampling methods; Monte-Carlo; Reliability Analysis; SRAM Core-cell;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2010 47th ACM/IEEE
  • Conference_Location
    Anaheim, CA, USA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-4244-6677-1
  • Type

    conf

  • Filename
    5522888