• DocumentCode
    523715
  • Title

    Parallel hierarchical cross entropy optimization for on-chip decap budgeting

  • Author

    Zhao, Xueqian ; Guo, Yonghe ; Feng, Zhuo ; Hu, Shiyan

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Michigan Technol. Univ., Houghton, MI, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    843
  • Lastpage
    848
  • Abstract
    Decoupling capacitor (decap) placement has been widely adopted as an effective way to suppress dynamic power supply noise. Traditional decap budgeting algorithms usually explore the sensitivity-based nonlinear optimizations or conjugate gradient methods, which can be prohibitively expensive for large-scale decap budgeting problems. We present a hierarchical cross entropy (CE) optimization technique for solving the decap budgeting problem. CE is an advanced optimization framework which explores the power of rare-event probability theory and importance sampling. To achieve high efficiency, a sensitivity-guided cross entropy (SCE) algorithm is proposed which integrates CE with a partitioning-based sampling strategy to effectively reduce the dimensionality in solving the large scale decap budgeting problems. Extensive experiments on industrial power grid benchmarks show that the proposed SCE method converges 2X faster than the prior methods and 10X faster than the standard CE method, while gaining up to 25% improvement on power grid supply noise. Importantly, the proposed SCE algorithm is parallel-friendly since the simulation samples of each SCE iteration can be independently obtained in parallel. We obtain up to 1.9X speedup when running the SCE decap budgeting algorithm on a dual-core-dual-GPU system.
  • Keywords
    Capacitors; Entropy; Gradient methods; Large-scale systems; Monte Carlo methods; Optimization methods; Partitioning algorithms; Power grids; Power supplies; Sampling methods; Cross-Entropy; Decoupling Capacitor; Parallel Computing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2010 47th ACM/IEEE
  • Conference_Location
    Anaheim, CA, USA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-4244-6677-1
  • Type

    conf

  • Filename
    5522930