• DocumentCode
    523787
  • Title

    Post-silicon validation opportunities, challenges and recent advances

  • Author

    Mitra, Subhasish ; Seshia, Sanjit A. ; Nicolici, Nicola

  • Author_Institution
    Dept. of EE, Stanford Univ., Stanford, CA, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    12
  • Lastpage
    17
  • Abstract
    Post-silicon validation is used to detect and fix bugs in integrated circuits and systems after manufacture. Due to sheer design complexity, it is nearly impossible to detect and fix all bugs before manufacture. Post-silicon validation is a major challenge for future systems. Today, it is largely viewed as an art with very few systematic solutions. As a result, post-silicon validation is an emerging research topic with several exciting opportunities for major innovations in electronic design automation. In this paper, we provide an overview of the post-silicon validation problem and how it differs from traditional pre-silicon verification and manufacturing testing. We also discuss major postsilicon validation challenges and recent advances.
  • Keywords
    Circuit faults; Circuit testing; Computer bugs; Computer crashes; Crosstalk; Digital systems; Integrated circuit manufacture; Manufacturing; System testing; Technological innovation; Post-silicon validation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2010 47th ACM/IEEE
  • Conference_Location
    Anaheim, CA, USA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-4244-6677-1
  • Type

    conf

  • Filename
    5523095