DocumentCode
523787
Title
Post-silicon validation opportunities, challenges and recent advances
Author
Mitra, Subhasish ; Seshia, Sanjit A. ; Nicolici, Nicola
Author_Institution
Dept. of EE, Stanford Univ., Stanford, CA, USA
fYear
2010
fDate
13-18 June 2010
Firstpage
12
Lastpage
17
Abstract
Post-silicon validation is used to detect and fix bugs in integrated circuits and systems after manufacture. Due to sheer design complexity, it is nearly impossible to detect and fix all bugs before manufacture. Post-silicon validation is a major challenge for future systems. Today, it is largely viewed as an art with very few systematic solutions. As a result, post-silicon validation is an emerging research topic with several exciting opportunities for major innovations in electronic design automation. In this paper, we provide an overview of the post-silicon validation problem and how it differs from traditional pre-silicon verification and manufacturing testing. We also discuss major postsilicon validation challenges and recent advances.
Keywords
Circuit faults; Circuit testing; Computer bugs; Computer crashes; Crosstalk; Digital systems; Integrated circuit manufacture; Manufacturing; System testing; Technological innovation; Post-silicon validation;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (DAC), 2010 47th ACM/IEEE
Conference_Location
Anaheim, CA, USA
ISSN
0738-100X
Print_ISBN
978-1-4244-6677-1
Type
conf
Filename
5523095
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