DocumentCode
523796
Title
BLoG: Post-Silicon bug localization in processors using bug localization graphs
Author
Park, Sung-Boem ; Bracy, Anne ; Wang, Hong ; Mitra, Subhasish
Author_Institution
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
fYear
2010
fDate
13-18 June 2010
Firstpage
368
Lastpage
373
Abstract
Post-silicon bug localization - the process of identifying the location of a detected hardware bug and the cycle(s) during which the bug produces error(s) - is a major bottleneck for complex integrated circuits. Instruction Footprint Recording and Analysis (IFRA) is a promising post-silicon bug localization technique for complex processor cores. However, applying IFRA to new processor microarchitectures can be challenging due to the manual effort required to implement special microarchitecture-dependent analysis techniques for bug localization. This paper presents the Bug Localization Graph (BLoG) framework that enables application of IFRA to new processor microarchitectures with reduced manual effort. Results obtained from an industrial microarchitectural simulator modeling a state-of-the-art complex commercial microarchitecture (Intel Nehalem, the foundation for the Intel Core™ i7 and Core™ i5 processor families) demonstrate that BLoG-assisted IFRA enables effective and efficient post-silicon bug localization for complex processors with high bug localization accuracy at low cost.
Keywords
microprocessor chips; security of data; IFRA technique; bug localization graphs; complex processor cores; instruction footprint recording and analysis; post-silicon bug localization; processor microarchitectures; Computer bugs; Computer science; Costs; Hardware; Information services; Internet; Manuals; Microarchitecture; Permission; Web sites; BLoG; IFRA; Silicon debug; post-silicon validation;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (DAC), 2010 47th ACM/IEEE
Conference_Location
Anaheim, CA
ISSN
0738-100X
Print_ISBN
978-1-4244-6677-1
Type
conf
Filename
5523125
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