• DocumentCode
    523951
  • Title

    Post-silicon is too late avoiding the $50 million paperweight starts with validated designs

  • Author

    Goodenough, John ; Aitken, Rob

  • Author_Institution
    ARM, San Jose, CA, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    8
  • Lastpage
    11
  • Abstract
    To ensure that an intellectual property (IP) block is validated ahead of its use in an `unknown´ system-on-chip (SoC) context, an holistic view of the integration process must be taken. We will focus on the challenges faced in integrating and manufacturing advanced low-power processor based SoC systems, which have dramatically increased the complexity & state space for logical and electrical validation. We describe the process taken by IP providers, tool vendors and the foundry supply chain to enable first time logical, electrical and manufacturing closure. We discuss how feedback is used to improve component IP validation strategies and interoperability and integration testing. We also cover techniques such as the role of hardware/software emulation for configuration testing, the application of formal techniques and advanced electrical rules checking. In addition, we will examine the role waivers and automated design-in guidelines to enable the integrator to balance risk reduction and design turnaround time. Finally we discuss manufacturing tests and how to link these back to improve the metrics used for component and integration level testing.
  • Keywords
    configuration management; electronic engineering computing; industrial property; integrated circuit testing; low-power electronics; open systems; program testing; state-space methods; system-on-chip; IP block; IP providers; SoC context; SoC systems; automated design-in guidelines; balance risk reduction; component IP validation strategy; configuration testing; electrical rules checking; formal techniques; foundry supply chain; hardware/software emulation; integration level testing; integration process; integration testing; intellectual property block; interoperability; low-power processor; post-silicon; role waivers; state space; system-on-chip; Emulation; Feedback; Foundries; Hardware; Intellectual property; Manufacturing processes; State-space methods; Supply chains; System-on-a-chip; Testing; Post-silicon validation; emulation; low power design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2010 47th ACM/IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-4244-6677-1
  • Type

    conf

  • Filename
    5523471