Title :
Dynamic virtual ground voltage estimation for power gating
Author :
Hao Xu ; Vemuri, Ranga ; Jone, Wen-Ben
Author_Institution :
Dept. of ECE, Univ. of Cincinnati, Cincinnati, OH, USA
Abstract :
With the technology moving into the deep sub-100 nm region, the increase of leakage power consumption necessitates more aggressive power reduction techniques. Power gating is a promising technique. Our research emphasizes the virtual ground voltage (VVG) as the key to make critical design trade-offs for power gating. We develop an accurate model to estimate the dynamic VVG value of a circuit block as a function of time after its ground is gated. Experimental results show that the model has less than 1% average error compared with HSPICE results. The CAD tool implemented based on the model has a 100 times speedup over HSPICE.
Keywords :
integrated circuit design; VVG; dynamic virtual ground voltage estimation; leakage power consumption; power gating; power reduction technique; CMOS technology; Circuit noise; Design automation; Dynamic voltage scaling; Energy consumption; Gate leakage; Leakage current; Logic circuits; MOSFET circuits; Power supplies; leakage power consumption; power gating; virtual ground voltage;
Conference_Titel :
Low Power Electronics and Design (ISLPED), 2008 ACM/IEEE International Symposium on
Conference_Location :
Bangalore
Print_ISBN :
978-1-4244-8634-2
Electronic_ISBN :
978-1-60558-109-5
DOI :
10.1145/1393921.1393934