• DocumentCode
    525635
  • Title

    Evaluating software reliability: Integration of MCDM and data mining

  • Author

    Peng, Yi ; Kou, Gang ; Wang, Honggang ; Wu, Wenshuai ; Honggang Wang

  • Author_Institution
    Sch. of Manage. & Econ., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2010
  • fDate
    23-25 June 2010
  • Firstpage
    613
  • Lastpage
    617
  • Abstract
    Although software reliability can be evaluated by applying data mining techniques in software engineering data to identify software defects or faults, it is difficult to select the best algorithm among the numerous data mining techniques. The goal of this paper is to propose a multiple criteria decision making (MCDM) framework for data mining algorithms selection in software reliability management. Through the application of MCDM method, this paper compares experimentally the performance of several popular data mining algorithms using 13 different performance metrics over 10 public domain software defect datasets from the NASA Metrics Data Program (MDP) repository. The results of the MCDM methods agree on top-ranked classification algorithms and differ about some classifiers for software defect datasets.
  • Keywords
    data mining; decision making; fault tolerant computing; pattern classification; software reliability; MCDM method; classification algorithms; data mining; multiple criteria decision making; public domain software defect datasets; software defects identification; software engineering data; software faults identification; software reliability evaluation; Application software; Data mining; Decision making; Fault diagnosis; Measurement; NASA; Software algorithms; Software engineering; Software performance; Software reliability; classification algorithm; knowledge-driven data mining; multiple criteria decision making (MCDM); software defect prediction; software reliability management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering and Data Mining (SEDM), 2010 2nd International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-7324-3
  • Electronic_ISBN
    978-89-88678-22-0
  • Type

    conf

  • Filename
    5542849