Title :
Ultra high speed short circuit protection for IGBT with gate charge sensing
Author :
Yuasa, Kazufumi ; Nakamichi, Soh ; Omura, Ichiro
Author_Institution :
Kyushu Inst. of Technol., Kitakyushu, Japan
Abstract :
Short circuit (SC) protection for IGBT has been crucial issue since IGBTs have become major switching devices for power electronics applications. According to the IGBT performance improvement, chip current density has been increased and the chip has become as thin as 100 μm. The high current density and thin wafer chip result in high temperature rising speed during SC condition and hence high speed protection scheme for IGBT is highly required. Conventional methods, such as sense IGBT configuration, have the response time of 5 micro second, for example, which is not sufficient to protect advanced IGBTs. In this paper, we propose a novel protection method with response time shorter than 1 micro second.
Keywords :
current density; insulated gate bipolar transistors; power bipolar transistors; power electronics; protection; short-circuit currents; IGBT; chip current density; gate charge sensing; high current density; high speed protection scheme; power electronics; size 100 mum; switching devices; thin wafer chip; time 5 mus; ultra high speed short circuit protection; Circuits; Insulated gate bipolar transistors; Protection;
Conference_Titel :
Power Semiconductor Devices & IC's (ISPSD), 2010 22nd International Symposium on
Conference_Location :
Hiroshima
Print_ISBN :
978-1-4244-7718-0
Electronic_ISBN :
1943-653X