DocumentCode
52592
Title
On-the-Field Test and Configuration Infrastructure for 2-D-Mesh NoCs in Shared-Memory Many-Core Architectures
Author
Zhen Zhang ; Refauvelet, Dimitri ; Greiner, Alain ; Benabdenbi, Mounir ; Pecheux, Francois
Author_Institution
INRIA Rocquencourt, Le Chesnay, France
Volume
22
Issue
6
fYear
2014
fDate
Jun-14
Firstpage
1364
Lastpage
1376
Abstract
This paper addresses the important issue of fault tolerance in network-on-chip (NoC) and presents an on-the-field test and configuration infrastructure for a 2-D-mesh NoC, which can be used in many generic shared-memory many-core tiled architectures and MPSoCs. This paper also details all the hardware and software means needed to: 1) initialize the NoC in a clean state (self-deactivation of faulty NoC components using a controlled built-in self-test strategy) and 2) set up a distributed collaborative configuration infrastructure that can be used to make the chip autonomously determine, during its initialization, the operational degraded architecture, identify and bypass black holes. Experimental results prove that the approach is effective and lightweight in terms of additional software and hardware resources.
Keywords
logic design; network-on-chip; shared memory systems; 2D mesh NoC; MPSoC; distributed collaborative configuration infrastructure; network on chip; on the field test; shared memory many core architectures; Built-in self-test; Circuit faults; Computer architecture; Hardware; Routing; Silicon; Topology; Built-in self-test (BIST); fault tolerance; many cores; network-on-chip (NoC); reconfiguration; test; test.;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2013.2271697
Filename
6565420
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