• DocumentCode
    52643
  • Title

    A 0.13 μm CMOS System-on-Chip for a 512 × 424 Time-of-Flight Image Sensor With Multi-Frequency Photo-Demodulation up to 130 MHz and 2 GS/s ADC

  • Author

    Bamji, Cyrus S. ; O´Connor, Patrick ; Elkhatib, Tamer ; Mehta, Sharad ; Thompson, Bradley ; Prather, Lawrence A. ; Snow, Dane ; Akkaya, Onur Can ; Daniel, Andy ; Payne, Andrew D. ; Perry, Travis ; Fenton, Mike ; Vei-Han Chan

  • Author_Institution
    Microsoft, Mountain View, CA, USA
  • Volume
    50
  • Issue
    1
  • fYear
    2015
  • fDate
    Jan. 2015
  • Firstpage
    303
  • Lastpage
    319
  • Abstract
    We introduce a 512 × 424 time-of-flight (TOF) depth image sensor designed in a TSMC 0.13 μm LP 1P5M CMOS process, suitable for use in Microsoft Kinect for XBOX ONE. The 10 μm × 10 μm pixel incorporates a TOF detector that operates using the quantum efficiency modulation (QEM) technique at high modulation frequencies of up to 130 MHz, achieves a modulation contrast of 67% at 50 MHz and a responsivity of 0.14 A/W at 860 nm. The TOF sensor includes a 2 GS/s 10 bit signal path, which is used for the high ADC bandwidth requirements of the system that requires many ADC conversions per frame. The chip also comprises a clock generation circuit featuring a programmable phase and frequency clock generator with 312.5-ps phase step resolution derived from a 1.6 GHz oscillator. An integrated shutter engine and a programmable digital micro-sequencer allows an extremely flexible multi-gain/multi-shutter and multi-frequency/multi-phase operation. All chip data is transferred using two 4-lane MIPI D-PHY interfaces with a total of 8 Gb/s input/output bandwidth. The reported experimental results demonstrate a wide depth range of operation (0.8-4.2 m), small accuracy error ( 1%), very low depth uncertainty ( 0.5% of actual distance), and very high dynamic range ( >64 dB).
  • Keywords
    CMOS image sensors; analogue-digital conversion; clocks; system-on-chip; 4-lane MIPI D-PHY interfaces; ADC bandwidth requirements; QEM technique; SoC; TOF detector; TSMC LP 1P5M CMOS process; clock generation circuit; extremely flexible multigain operation; frequency clock generator; integrated shutter engine; multifrequency operation; multifrequency photodemodulation; multiphase operation; multishutter operation; phase step resolution; programmable digital microsequencer; programmable phase; quantum efficiency modulation technique; signal path; size 0.13 mum; system-on-chip; time 312.5 ps; time-of-flight depth image sensor; word length 10 bit; Arrays; Clocks; Logic gates; Modulation; Optical imaging; System-on-chip; Uncertainty; 3D imaging; Natural user interface (NUI); quantum efficiency modulation (QEM); range imaging; time-of-flight (TOF);
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2014.2364270
  • Filename
    6964815