DocumentCode
526458
Title
An approach for mutation testing using elitist genetic algorithm
Author
Mishra, K.K. ; Tiwari, Shailesh ; Kumar, Anoj ; Misra, A.K.
Author_Institution
Comput. Sci. & Eng. Dept., MNNIT, Allahabad, India
Volume
5
fYear
2010
fDate
9-11 July 2010
Firstpage
426
Lastpage
429
Abstract
Mutation Testing is used as fault-based testing to overcome limitations of other testing approaches but it is recognized as expensive process. In mutation testing, a good test case is one that kills one or more mutants, by producing different mutant output from the original program. Evolutionary algorithms have been proved its suitability for reducing the cost of data generation in different testing methodologies. In order to reduce the cost of mutation testing, efficient test cases are generated that reveal faults and kill mutants. In this paper, we develop a new strategy for generating efficient test input data in the context of mutation testing.
Keywords
genetic algorithms; program testing; data generation cost; elitist genetic algorithm; evolutionary algorithms; fault-based testing; mutation testing; Algorithm design and analysis; Buildings; Genetics; Heuristic algorithms; Irrigation; Testing; Elitist Genetic Algorithm; Genetic Algorithm; Mutation Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Science and Information Technology (ICCSIT), 2010 3rd IEEE International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-5537-9
Type
conf
DOI
10.1109/ICCSIT.2010.5564072
Filename
5564072
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