DocumentCode :
52694
Title :
Performance Evaluation of PLC Under the Combined Effect of Background and Impulsive Noises
Author :
Mathur, Aashish ; Bhatnagar, Manav R. ; Panigrahi, Bijaya K.
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol.-Delhi, New Delhi, India
Volume :
19
Issue :
7
fYear :
2015
fDate :
Jul-15
Firstpage :
1117
Lastpage :
1120
Abstract :
Power line communication (PLC) is the use of power lines for the purpose of electronic data transmission. The presence of additive noise, namely, background noise and impulsive noise, significantly affects the performance of a PLC system. While the background noise is modeled by Nakagami-m distribution, the impulsive noise is modeled using Middleton class A distribution. In this letter, we study the performance of a PLC system under the combined effect of Nakagami-m background noise and Middleton class A impulsive noise assuming binary phase shift keying signaling. The probability density function of decision variable under the influence of additive noise (sum of background noise and impulsive noise) is derived. We also derive an analytical expression for the average bit error rate of the considered PLC system. The analytical expressions are validated by close matching to the simulation results. The analysis presented in this letter closely predicts the behavior of the PLC system under the combined effect of background and impulsive noises.
Keywords :
Nakagami channels; carrier transmission on power lines; error statistics; impulse noise; phase shift keying; probability; Middleton class A distribution; Middleton class A impulsive noise; Nakagami-m background noise; PLC system; additive noise; background noise; binary phase shift keying signaling; bit error rate; electronic data transmission; power line communication; probability density function; Additive noise; Binary phase shift keying; Bit error rate; Noise measurement; Power line communications; Signal to noise ratio; Background noise; Middleton class A distribution; Nakagami- $m$ distribution; Nakagami-m distribution; binary phase shift keying; bit error rate; impulsive noise; power line communications; power line communications (PLC);
fLanguage :
English
Journal_Title :
Communications Letters, IEEE
Publisher :
ieee
ISSN :
1089-7798
Type :
jour
DOI :
10.1109/LCOMM.2015.2429129
Filename :
7101244
Link To Document :
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