DocumentCode :
527188
Title :
Reliability growth analysis of randomly censored data
Author :
Qingtian, Han ; Lian, Li ; Xiaoyan, Gao
Author_Institution :
Naval Aeronaut. & Astronaut. Univ., Yantai, China
Volume :
3
fYear :
2010
fDate :
17-18 July 2010
Firstpage :
610
Lastpage :
612
Abstract :
Randomly censored data is often met in reliability assessment, since individuals withdraw from test for some reason or haven´t failed at the end of the test. Current methods don´t make full use of censor information, and only use the positions or sequence of censors, not the exact times. In the paper, a modified method has been used to combine non-parametric and parametric features, and made fully use of the censor information. Thus, more accurate and practical results were obtained. An engineering calculating example shows the fine performance of the method and the results are practical.
Keywords :
data analysis; reliability theory; censor information; nonparametric feature; parametric feature; randomly censored data; reliability assessment; reliability growth analysis; Analytical models; Implants; Maximum likelihood estimation; Presses; Reliability; Suspensions; censored data; reliability assessment; repairable system;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Environmental Science and Information Application Technology (ESIAT), 2010 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-7387-8
Type :
conf
DOI :
10.1109/ESIAT.2010.5568453
Filename :
5568453
Link To Document :
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