• DocumentCode
    528374
  • Title

    Trench structure metal-oxide-semiconductor (MOS) solar cells with oxides prepared by anodization technique

  • Author

    Wang, Chih-Yao ; Hwu, Jenn-Gwo

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2010
  • fDate
    5-9 July 2010
  • Firstpage
    366
  • Lastpage
    367
  • Abstract
    This work presented the new trench structure of MOS solar cell with efficiency improved by the trap-assisted centers built on the side wall as the extra current path. The perimeter of electrode is critical for MOS solar cell.
  • Keywords
    MIS devices; anodisation; solar cells; MOS; anodization; electrode perimeter; metal-oxide-semiconductor solar cells; trap-assisted centers; trench structure solar cells; Current density; Electrodes; Insulators; Logic gates; Photovoltaic cells; Semiconductor device measurement; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    OptoElectronics and Communications Conference (OECC), 2010 15th
  • Conference_Location
    Sapporo
  • Print_ISBN
    978-1-4244-6785-3
  • Type

    conf

  • Filename
    5588586