• DocumentCode
    528505
  • Title

    I/O characterization on a parallel file system

  • Author

    Narayan, Sumit ; Chandy, John A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Connecticut, Storrs, CT, USA
  • fYear
    2010
  • fDate
    11-14 July 2010
  • Firstpage
    133
  • Lastpage
    140
  • Abstract
    In this paper we present a study of I/O access patterns of scientific and general applications on a parallel file system. Understanding I/O access patterns is an essential condition to effectively designing a file system. Supercomputing applications running on these parallel systems make extensive use of parallel file systems taking advantage of faster data access by requesting information from multiple nodes simultaneously. However, parallel file systems can become a bottleneck if the file distribution parameters do not fit the access scheme of the applications. In our work, we examine a variety of such applications, providing measurement of inter-arrival times, I/O request size and burstiness demanded from a parallel file system. Our tests were conducted on the open source PVFS parallel file system with different configurations of metadata servers and I/O nodes. Among the findings are that the standard assumption of Poisson or random interarrival times is not justified and that access sizes are smaller than would be expected for a parallel application.
  • Keywords
    information retrieval; input-output programs; meta data; parallel processing; public domain software; I/O access pattern; I/O node; I/O request size; Poisson arrival time; burstiness demand; file distribution parameter; interarrival time; metadata server; open source PVFS parallel file system; parallel file system; random inter arrival time; supercomputing; Benchmark testing; Checkpointing; Libraries; Object oriented modeling; Prefetching; Web server;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Performance Evaluation of Computer and Telecommunication Systems (SPECTS), 2010 International Symposium on
  • Conference_Location
    Ottawa, ON
  • Print_ISBN
    978-1-56555-340-8
  • Type

    conf

  • Filename
    5588965