• DocumentCode
    529166
  • Title

    Multi-class system based on SVM for real-time gas mixture classification

  • Author

    Kim, Guk Hee ; Kim, Young Wung ; Lee, Sang Jin ; Jeon, Gi Joon

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Kyungpook Nat. Univ., Daegu, South Korea
  • fYear
    2010
  • fDate
    18-21 Aug. 2010
  • Firstpage
    1764
  • Lastpage
    1767
  • Abstract
    In this work we address the use of support vector machine (SVM) in the multi-class gas classification system. In our case, the objective is to classify single gases and their gas mixture with a semiconductor-type electronic nose. The support vector machine is a powerful tool for solving the problem with small sampling, non-linearity and high dimension. The SVM has some typical multi-class classification models, which are One vs One (OVO) and One vs All (OVA). But their studies show weaknesses on calculation time, decision time and the reject region. We propose a method of multi class system based on the SVM using hierarchical clustering analysis for real time gas classification. Experimental results show that the proposed method has the best performance compared with the typical multi-class systems based on the SVM, and this method make it possible to classify easily and fast in the real embedded system compared with BP-MLP and Fuzzy ARTMAP.
  • Keywords
    electronic noses; embedded systems; gas mixtures; pattern classification; pattern clustering; support vector machines; BP-MLP; SVM; fuzzy ARTMAP; hierarchical clustering analysis; multiclass gas classification system; one vs all; one vs one; real embedded system; real time gas mixture classification; semiconductor type electronic nose; support vector machine; Electronic noses; Embedded system; Gases; Optimization; Real time systems; Support vector machines; Training; hierarchical structure; mixture gas classification; multi-class system; support vector machine;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SICE Annual Conference 2010, Proceedings of
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-7642-8
  • Type

    conf

  • Filename
    5602348