Title :
A computerized method for carrier lifetime measurement in PN junctions at high and low-level injection
Author :
Montero, Sebastián ; Cedola, A.P. ; Cappelletti, Marcelo A. ; Blancá, Eitel L Peltzer Y
Author_Institution :
Dept. de Electrotecnia, Univ. Nac. de La Plata, La Plata, Argentina
Abstract :
A system to determine the minority carrier lifetime in PN semiconductor junctions in the range of 50 ns to 100 μs has been developed. The measurement is performed by using the Open Circuit Voltage Decay (OCVD) technique. The equipment consists mainly of a data acquisition system based on a PIC16F877A microcontroller, connected to a computer, and software for the control of the entire system, data processing, storage and visualization of results.
Keywords :
data acquisition; electronic engineering computing; measurement systems; microcontrollers; p-n junctions; PIC16F877A microcontroller; PN semiconductor junctions; carrier lifetime measurement; computerized method; data acquisition system; data processing; data storage; data visualization; high-level injection; low-level injection; open circuit voltage decay technique; time 50 ns to 100 mus; Charge carrier lifetime; Converters; Current measurement; Junctions; Radiative recombination; Semiconductor device measurement; Voltage measurement; Carrier lifetime; OCVD technique; experimental measurement; microcontroller;
Conference_Titel :
Argentine School of Micro-Nanoelectronics Technology and Applications (EAMTA), 2010
Conference_Location :
Montevideo
Print_ISBN :
978-1-4244-6747-1
Electronic_ISBN :
978-987-1620-14-2
