• DocumentCode
    530445
  • Title

    The dynamic testing technology of automobile exhaust

  • Author

    Gu, Zhixin ; Wang, Shuyang ; Xu, Kaihong ; Liu, Xiangdong

  • Author_Institution
    Coll. of Electromech. Eng., Northeast Forestry Univ., Harbin, China
  • Volume
    2
  • fYear
    2010
  • fDate
    24-26 Aug. 2010
  • Firstpage
    37
  • Lastpage
    40
  • Abstract
    Dynamic testing is actually testing during the course of vehicle emissions, reflecting the real situation. Through the integration of detection equipment and analysis software, it realized real-time detection, data analysis and troubleshooting. Using single-chip microcomputer control technology development, it designed microcontrollers and gas sensors as the core of the hardware system. Using embedded C language, it designed software system of according with national emission standards, realized the PC and the realization of hardware interconnection, completed dynamic testing, calibration and communications functions, etc. It used wireless communication technology for data transmission, thus saving space and line interference. Promoting the process of automobile exhaust emission control in China, the study provides new ideas of management of vehicle emissions.
  • Keywords
    C language; air pollution; automotive components; automotive engineering; calibration; dynamic testing; emission; exhaust systems; gas sensors; microcontrollers; China; analysis software; automobile exhaust emission control; calibration function; communications function; completed dynamic testing; data analysis; data transmission; detection equipment; dynamic testing technology; embedded C language; gas sensors; hardware interconnection; microcontrollers; national emission standards; single-chip microcomputer control technology; vehicle emission; wireless communication technology; CMOS integrated circuits; Carbon dioxide; Circuit synthesis; Lakes; Sensors; Wireless communication; Wireless sensor networks; SCM; automobile exhaust; dynamic test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer, Mechatronics, Control and Electronic Engineering (CMCE), 2010 International Conference on
  • Conference_Location
    Changchun
  • Print_ISBN
    978-1-4244-7957-3
  • Type

    conf

  • DOI
    10.1109/CMCE.2010.5609558
  • Filename
    5609558