• DocumentCode
    531682
  • Title

    1-chip balanced FBAR filter for wireless handsets

  • Author

    Shin, Jea-Shik ; Park, Yun-kwon ; Kim, Young-Il ; Kim, Chul-Soo ; Lee, Jae-Chun ; Kim, Duck-Hwan ; Kim, Hyung-rak ; Hwang, Sung-woo ; Song, In-sang

  • Author_Institution
    Commun. Lab., Samsung Adv. Inst. of Technol., Yongin, South Korea
  • fYear
    2010
  • fDate
    28-30 Sept. 2010
  • Firstpage
    1257
  • Lastpage
    1260
  • Abstract
    There is great demand for ultra-miniature and balanced RF filters as an essential component in communication systems. To make these needs, we proposed 1-chip balanced FBAR RF filter in this work. A novel FBAR configuration is developed to reduce the area of FBAR block and to enhance performance. And a novel balanced filter topology which can work without trimming inductors is proposed to realize 1-chip balanced RF filter. We also develop the wafer level package using silicon wafers to prevent the increase of size and cost of the filters. The characteristic of fabricated filter is measured 1.75dB as a highest insertion loss in the pass-band (1930-1990MHz) and majority is measured as excellent performance within 1.7dB. Attenuation characteristic is measured very excellent performance as over 33dB in the range between 1850MHz to 1910MHz. In this work, the balanced RF filters are achieved as small as 1.2 mm × 1.2 mm.
  • Keywords
    acoustic resonator filters; band-pass filters; bulk acoustic wave devices; electromagnetic wave scattering; network topology; radio equipment; radiofrequency filters; wafer level packaging; 1-chip balanced FBAR RF filter; FBAR block; attenuation characteristic; balanced filter topology; communication system; fabricated filter; film bulk acoustic resonator; frequency 1850 MHz to 1910 MHz; frequency 1930 MHz to 1990 MHz; loss 1.75 dB; pass-band filter; silicon wafer; ultra-miniature filter; wafer level package; wireless handset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (EuMC), 2010 European
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-7232-1
  • Type

    conf

  • Filename
    5616666