Dual-channel microwave scanning probe microscopy for nanotechnology and molecular biology

Author

Fabiani, Silvia ; Lucesoli, Agnese ; Di Donato, Andrea ; Mencarelli, Davide ; Venanzoni, Giuseppe ; Morini, Antonio ; Rozzi, Tullio ; Farina, Marco

Author_Institution

Dipt. di Bioingegneria, Elettron. e Telecomun., Univ. Politec. delle Marche, Ancona, Italy

fYear

2010

fDate

28-30 Sept. 2010

Firstpage

767

Lastpage

770

Abstract

In this work we describe a new dual-channel scanning probe microscope performing simultaneously Scanning Tunneling Microscopy (STM) and wide-band Near Field Scanning Microwave Microscopy (wide-band SMM). Our SMM system exploits the STM feedback to keep a suitable distance between probe and sample. The system is new because our SMM performs broadband measurements of the reflection coefficient across the STM probe by means of an external VNA with no resonant circuit. A post-processing algorithm reduces the noise by comparing images recorded at different close frequencies.

Keywords

molecular biophysics; nanotechnology; near-field scanning optical microscopy; optical variables measurement; scanning tunnelling microscopy; SMM; STM; dual-channel scanning probe microscopy; molecular biology; nanotechnology; reflection coefficient measurements; scanning tunneling microscopy; wide-band near field scanning microwave microscopy; Microwave Imaging; Microwave Measurement; Nanotechnology; Scanning Probe Microscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference (EuMC), 2010 European

Conference_Location

Paris

Print_ISBN

978-1-4244-7232-1

Type

conf

Filename

5616670