Microwave resistance of metal-dielectric film nanocomposites Cox(SiO2)1−x

Author

Rinkevich, A.B. ; Perov, D.V. ; Vaskovsky, V.O. ; Gorkovenko, A.N. ; Kuznetsov, E.A.

Author_Institution

Inst. of Metal Phys. Ural Div., Russian Acad. of Sci., Ekaterinburg, Russia

fYear

2010

fDate

28-30 Sept. 2010

Firstpage

894

Lastpage

897

Abstract

Penetration and reflection of millimeter waveband electromagnetic waves have been studied for thin film metal-dielectric nanocomposite Co_x(SiO₂)_1-x materials, in which cobalt nanoparticles are placed inside of 100 nm thickness SiO₂ film. Microwave properties of nanocomposite samples with different cobalt content have been measured. Measurements are carried out in frequency range from 26 to 38 GHz. The frequency dependencies of transmission and reflection coefficients are obtained. Share of power loss in the samples was calculated. The algorithm for conductivity reconstruction from the transmission coefficient frequency dependence was worked out. It was found that the microwave conductivity arises with increase of cobalt content and differs essentially from dc conductivity.

Keywords

cobalt compounds; granular materials; high-frequency effects; microwave materials; millimetre wave materials; nanocomposites; Co_x(SiO₂)_1-x; dc conductivity; frequency 26 GHz to 38 GHz; metal-dielectric film; microwave resistance; millimeter wave penetration; millimeter wave reflection; nanocomposite; reflection coefficient; transmission coefficient;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference (EuMC), 2010 European

Conference_Location

Paris

Print_ISBN

978-1-4244-7232-1

Type

conf

Filename

5616693