• DocumentCode
    532644
  • Title

    Shock wave pressure testing two-channel storage

  • Author

    Zhang, Jian-Xin ; Zhang, He ; Zhou, Xing

  • Author_Institution
    Ministerial Key Lab. of ZNDY, Nanjing Univ. of Sci. & Tech., Nanjing, China
  • Volume
    14
  • fYear
    2010
  • fDate
    22-24 Oct. 2010
  • Abstract
    According to the problem of low stable system, not high test circuit integration, unitary measured data,and data easy to lose in testing overpressure signal during the explosion,methods of stored testing and measuring by using Internal and external control trigger modeare presented. In this method, the explosion signal is collected and memoried by two channels at the same time. The first channel to capture the signal changes in the value of trigger signals, and the data stored in memory channel 1; the second channel used the explosion of ammunition as external interrupt to control signal collecting,and the data stored in memory channel 2. Analysis and tests show that the combination of two memory testing methods is able to maximize the impact of reduced external interference signals; the data is stored in nonvolatile memory during the data collection process and kept real time, which can effectively improve the reliability of a single test and maximize the system availability.
  • Keywords
    circuit reliability; circuit testing; random-access storage; shock waves; data collection process; data easy; explosion signal; external control trigger mode; interference signal; memory channel; memory testing method; nonvolatile memory; overpressure signal; reliability; shock wave pressure testing; stable system; system availability; test circuit integration; trigger signal; two-channel storage; unitary measured data; Control systems; Electronic mail; Energy measurement; Measurement uncertainty; Process control; Semiconductor device measurement; Reliability; Shock wave; Stored testing and measuring; Two-channel;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Application and System Modeling (ICCASM), 2010 International Conference on
  • Conference_Location
    Taiyuan
  • Print_ISBN
    978-1-4244-7235-2
  • Electronic_ISBN
    978-1-4244-7237-6
  • Type

    conf

  • DOI
    10.1109/ICCASM.2010.5622115
  • Filename
    5622115