• DocumentCode
    533352
  • Title

    Impact of the power supply on the ESD system level robustness

  • Author

    Giraldo, Sandra ; Salaméro, Christophe ; Caignet, Fabrice

  • Author_Institution
    ON Semicond., Toulouse, France
  • fYear
    2010
  • fDate
    3-8 Oct. 2010
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This work presents the case study of the response of an audio amplifier IC stressed while powered up. Under these conditions, the discharge current path varies from that in the unpowered circuit. Complete simulations have been performed and compared to measurements to highlight the IC´s failure under system ESD stress conditions.
  • Keywords
    analogue integrated circuits; audio-frequency amplifiers; electrostatic discharge; failure analysis; power supply circuits; ESD system level robustness; IC failure; audio amplifier IC; power supply; unpowered circuit; Capacitance; Current measurement; Discharges; Electrostatic discharge; IEC; Power supplies; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD), 2010 32nd
  • Conference_Location
    Reno, NV
  • Print_ISBN
    978-1-58537-182-2
  • Electronic_ISBN
    978-1-58537-182-2
  • Type

    conf

  • Filename
    5623720