Title :
Study of power arrays in ESD operation regimes
Author :
Aliaj, Blerina ; Vashchenko, Vladislav ; Lindorfer, Philipp ; Tcherniaev, Andrew ; Ershov, Maxim ; Liou, Juin J. ; Hopper, Peter
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Univ. of Central Florida, Orlando, FL, USA
Abstract :
The self-protection capability of arrays as a layout dependent parameter have been studied using a novel 2.5D simulation methodology. Several topology elements are identified to improve HBM robustness of the arrays. The physical effects responsible for local burnout are demonstrated based upon simulation tool capability.
Keywords :
electrostatic discharge; 2.5D simulation methodology; ESD operation regimes; HBM robustness; layout dependent parameter; physical effects; power arrays; self-protection array capability; Current distribution; Electrostatic discharge; Layout; Logic gates; Metals; Resistance;
Conference_Titel :
Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD), 2010 32nd
Conference_Location :
Reno, NV
Print_ISBN :
978-1-58537-182-2
Electronic_ISBN :
978-1-58537-182-2
