• DocumentCode
    533379
  • Title

    Pitfalls for CDM calibration procedures

  • Author

    Smedes, T. ; Polewski, M. ; van IJzerloo, A. ; Lefebvre, J.L. ; Dekker, M.

  • Author_Institution
    NXP Semicond., Nijmegen, Netherlands
  • fYear
    2010
  • fDate
    3-8 Oct. 2010
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    A product qualification gave very different results for CDM testing between 3 labs. This paper describes the investigation into the root cause of these differences. The most relevant issues are the measurement bandwidth and the quality of the calibration modules. An improved procedure is proposed.
  • Keywords
    calibration; electrostatic discharge; testing; CDM calibration procedures; CDM testing; calibration module quality; measurement bandwidth; Calibration; Capacitance; Capacitance measurement; Current measurement; Discharges; Oscilloscopes; Standards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD), 2010 32nd
  • Conference_Location
    Reno, NV
  • Print_ISBN
    978-1-58537-182-2
  • Electronic_ISBN
    978-1-58537-182-2
  • Type

    conf

  • Filename
    5623749
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=533379