DocumentCode
533384
Title
Impact of difference between discharging methods on CDM testing
Author
Morishita, Yasuyuki ; Ishizuka, Hiroyasu ; Hiraoka, Takayuki ; Hashimoto, Kenji ; Wakai, Nobuyuki ; Kumashiro, Shigetaka ; Mogami, Thoru
Author_Institution
NEC Sagamihara Plant, MIRAI-Selete, Sagamihara, Japan
fYear
2010
fDate
3-8 Oct. 2010
Firstpage
1
Lastpage
6
Abstract
We present significant difference between the relay and air discharging methods in CDM testing. The relay discharging method can give inaccurate CDM threshold levels in IC device qualification, which is due to parasitic elements within the relay. It is shown that the air discharging is a better testing method to emulate CDM event under natural discharging condition although it has disadvantage in repeatability.
Keywords
discharges (electric); integrated circuit testing; CDM testing; CDM threshold levels; IC device qualification; air discharging methods; parasitic elements; relay discharging method; Current measurement; Discharges; Electrostatic discharge; Films; Logic gates; Relays; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD), 2010 32nd
Conference_Location
Reno, NV
Print_ISBN
978-1-58537-182-2
Electronic_ISBN
978-1-58537-182-2
Type
conf
Filename
5623754
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