DocumentCode :
533395
Title :
ESD events of cabled GMR sensors
Author :
Iben, Icko Eric Timothy
Author_Institution :
Tape Head Dev. Group, IBM Corp., San Jose, CA, USA
fYear :
2010
fDate :
3-8 Oct. 2010
Firstpage :
1
Lastpage :
6
Abstract :
ESD damage from cable discharge events (CDEs) of magnetoresistive sensors is a major problem in manufacturing of magnetic tape and hard disk drives. CDEs initiated by contact to the cable pads used to connect to external electronics represent one source. This paper addresses CDEs from other points of contact, including capacitive coupling to metal objects contacting the cable. In order for capacitively coupled ESD events to damage the sensor the capacitive coupling of the two sensor leads to the external object being discharge must be different.
Keywords :
cables (electric); electrostatic discharge; magnetic sensors; magnetoresistive devices; CDE; cable discharge events; cable pads; cabled GMR sensors; capacitive coupling; coupled ESD events; hard disk drives; magnetic tape manufacturing; magnetoresistive sensors; Electrostatic discharge; Lead; Magnetic sensors; Power cables; Resistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD), 2010 32nd
Conference_Location :
Reno, NV
Print_ISBN :
978-1-58537-182-2
Electronic_ISBN :
978-1-58537-182-2
Type :
conf
Filename :
5623766
Link To Document :
بازگشت