Title :
A study on the application of on-chip EOS/ESD full-protection device for TMR heads
Author :
Tag-at, Ray Nicanor M ; Li, Lloyd Henry
Author_Institution :
SEPZ, Hitachi Global Storage Technol. Philippines Corp., Laguna, Philippines
Abstract :
On-chip EOS/ESD full-protection for TMR heads can be achieved using shunt diodes that are mounted permanently in the TMR device. This consists of two semiconductor diodes connected in parallel and in reverse order across the reader pads of TMR heads. This method also increases the ESD threshold of the TMR heads.
Keywords :
electrostatic discharge; magnetic sensors; semiconductor diodes; tunnelling magnetoresistance; TMR heads; TMR sensor; on-chip EOS-ESD full-protection device; semiconductor diodes; shunt diodes; Capacitance; Electrostatic discharge; Integrated circuit modeling; SPICE; Schottky diodes; Tunneling magnetoresistance;
Conference_Titel :
Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD), 2010 32nd
Conference_Location :
Reno, NV
Print_ISBN :
978-1-58537-182-2
Electronic_ISBN :
978-1-58537-182-2
