DocumentCode
533760
Title
Express analysis of MMIC limiters reliability based on numerical modeling of thermal processes
Author
Vorobiyov, A.A. ; Krutov, A.V. ; Rebrov, A.S.
Author_Institution
FSUE RPC Istok, Fryazino, Russia
fYear
2010
fDate
13-17 Sept. 2010
Firstpage
216
Lastpage
217
Abstract
In the present article an express analysis of mmic limiters reliability based on numerical modeling of thermal processes are presented. The simulated results of diode maximum junction temperature versus power dissipation are shown. Experimental MTTF determination of the test diode is made.
Keywords
MMIC; integrated circuit reliability; integrated circuit testing; microwave diodes; microwave limiters; numerical analysis; MMIC limiter reliability; diode maximum junction temperature; numerical modeling; power dissipation; thermal processes; Analytical models; Junctions; MMICs; Numerical models; Power dissipation; Semiconductor device reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Telecommunication Technology (CriMiCo), 2010 20th International Crimean Conference
Conference_Location
Sevastopol
Print_ISBN
978-1-4244-7184-3
Type
conf
DOI
10.1109/CRMICO.2010.5632524
Filename
5632524
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