• DocumentCode
    534210
  • Title

    Optimization of Detection Strategy in Electronics Assembly

  • Author

    Jianguo, Jiang ; Chunyan, Liu ; Cheng, Cheng

  • Author_Institution
    Comput. Sch., Xidian Univ., Xi´´an, China
  • Volume
    2
  • fYear
    2010
  • fDate
    16-18 July 2010
  • Firstpage
    88
  • Lastpage
    91
  • Abstract
    The requirements of the electronic equipment in high-quality, high reliability and easy maintenance are more and more high, and, the request of the detection technology is increasingly strict, but, with the restriction of the detection capability and detection range, the single detection technology can not meet the above requirements. In order to solve those problems, the purpose of this paper is to improve the quality and efficiency of the high-density electronic circuit module. For the existing problems and deficiency of the detection technology in electronic assembly industry, the detection process is deeply researched and the combinatorial optimization algorithm is proposed, meanwhile, the optimization of detection strategy distributes the usage process of the equipment effectively and the purpose of comprehensive and cost-effective combination detection is achieved.
  • Keywords
    automatic optical inspection; electromagnetic interference; integrated circuit reliability; integrated circuit testing; maintenance engineering; optimisation; printed circuit testing; EMScan; automatic optical inspection; combinatorial optimization algorithm; cost-effective combination detection; detection strategy optimization; detection technology; electronic assembly industry; electronic equipment; electronics assembly; high-density electronic circuit module; in-circuit tester; maintenance; reliability; Circuit faults; Electronic circuits; Integrated circuit reliability; Optimization; Soldering; combined detection; high-density electronic circuits; optimization algorithm; single detection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Technology and Applications (IFITA), 2010 International Forum on
  • Conference_Location
    Kunming
  • Print_ISBN
    978-1-4244-7621-3
  • Electronic_ISBN
    978-1-4244-7622-0
  • Type

    conf

  • DOI
    10.1109/IFITA.2010.208
  • Filename
    5634909