DocumentCode :
534316
Title :
Development of vertical superlattices in silicon for on-chip thermal management
Author :
Parasuraman, Jayalakshmi ; Bardoux, Mathieu ; Basset, Philippe ; Angelescu, Dan ; Chantrenne, Patrice ; Bourouina, Tarik
Author_Institution :
Lab. ESYCOM, Univ. Paris-Est, Paris, France
fYear :
2010
fDate :
6-8 Oct. 2010
Firstpage :
1
Lastpage :
3
Abstract :
In this paper, we propose a novel approach to on-chip cooling by thermionic emission by using vertical superlattices fabricated directly into the silicon wafer as opposed to conventional planar additive deposition methods used by most other groups. The advantages of this method are (i) significantly lower fabrication costs and (ii) adequate number of superlattice layers translating to higher efficiency. Initial fabrication has been completed on micro-scale `superlattices´ and work on `nano´-superlattices for actual thermionic emission and on-chip cooling are on-going. Measurements of thermal conductivity have been proposed to be made on the completed devices using the 2ω method. Further work will lead to conclusive results from this approach.
Keywords :
cooling; superlattices; thermal management (packaging); thermionic emission; microscale superlattices; nanosuperlattices; on-chip cooling; on-chip thermal management; planar additive deposition; silicon wafer; superlattice layers; thermionic emission; vertical superlattices; Conductivity; Cooling; Metals; Silicon; Superlattices; Temperature measurement; Thermal conductivity; DRIE; On-chip cooling; thermionic emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal Investigations of ICs and Systems (THERMINIC), 2010 16th International Workshop on
Conference_Location :
Barcelona
Print_ISBN :
978-1-4244-8453-9
Type :
conf
Filename :
5636317
Link To Document :
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