DocumentCode
534732
Title
Characteristics of stimulus artifacts in EEG recordings induced by electrical stimulation of cochlear implants
Author
Li, Xiaoxia ; Nie, Kaibao ; Karp, Floyd ; Tremblay, Kelly L. ; Rubinstein, Jay T.
Author_Institution
Province-Minist. Joint Key Lab. of Electromagn. Field & Electr. Apparatus Reliability, Hebei Univ. of Technol., Tianjin, China
Volume
2
fYear
2010
fDate
16-18 Oct. 2010
Firstpage
799
Lastpage
803
Abstract
Cortical auditory evoked potentials (CAEPs) are frequently used to detect the maturational status of the central auditory system in both healthy persons and cochlear implant listeners. However, with cochlear implant patients, the CAEP is partly or completely submerged in stimulus artifacts induced by current stimulation, making it difficult to faithfully detect auditory evoked potentials with cochlear implants. The aim of this study was to determine if a systematic relationship exists between the artifacts and cochlear implant fitting parameters using speech-like or tone stimuli. Chicken carcus was used as an experimental model to record stimulus artifacts at various implant settings, e.g. monopolar/bipolar stimulation, pulse width, and most comfortable level. The influence of the implant parameter variation on stimulus artifacts was systematically studied. The results of this study could potentially provide useful information for developing methods of eliminating stimulus artifacts in EEG recordings with cochlear implant patients.
Keywords
cochlear implants; electroencephalography; neurophysiology; EEG recording; central auditory system; chicken carcus; cochlear implant fitting parameters; cochlear implant patients; cortical auditory evoked potential; current stimulation; electrical stimulation; maturational status; monopolar bipolar stimulation; pulse width; stimulus artifacts; Auditory system; Cochlear implants; Electrodes; Electroencephalography; Fitting; Speech; Cortical auditory evoked potentials; cochlear implants; stimulus artifacts;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Engineering and Informatics (BMEI), 2010 3rd International Conference on
Conference_Location
Yantai
Print_ISBN
978-1-4244-6495-1
Type
conf
DOI
10.1109/BMEI.2010.5639942
Filename
5639942
Link To Document