• DocumentCode
    53478
  • Title

    Techniques for the Development of Multistage Depressed Collectors

  • Author

    Latha, A. Mercy ; Sharma, Rajendra Kumar ; Kumar, Yogesh ; Ghosh, Sanjay Kumar

  • Author_Institution
    Microwave Tubes Div., Council for Sci. & Ind. Res., Pilani, India
  • Volume
    62
  • Issue
    6
  • fYear
    2015
  • fDate
    Jun-15
  • Firstpage
    2038
  • Lastpage
    2043
  • Abstract
    Multistage depressed collectors (MDCs) play a vital role in efficiency enhancement of traveling-wave tubes for various strategic and communication applications. Design of a highly efficient MDC is no longer a tough challenge due to the availability of large number of efficient numerical simulation tools. However, still an established technique for the development of such MDCs to address their thermal as well as high-voltage breakdown issues has not been published. In this paper, we have exercised different development techniques in the light of specified meritorious aspects with respect to actual dimensional accuracies, thermal dissipation, and high-voltage withstanding capability. We have made use of an analytical method to estimate the proper braze alloy quantity and holding time during brazing operation to ensure optimum brazing, thereby, yielding minimum thermal impedance and improved high-voltage breakdown strength.
  • Keywords
    brazing; electric breakdown; thermal analysis; travelling wave tubes; MDC; braze alloy quantity; brazing operation; dimensional accuracy; high-voltage breakdown strength; high-voltage withstanding capability; multistage depressed collector; thermal breakdown; thermal dissipation; thermal impedance; traveling-wave tube; Electric breakdown; Electrodes; Electron tubes; Estimation; Joints; Metals; Analytical model; brazing quality; high-voltage breakdown; multistage depressed collectors (MDCs); thermal dissipation; traveling-wave tube (TWT); traveling-wave tube (TWT).;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2015.2423618
  • Filename
    7101829